We present a precision measurement of transverse diffusion coefficients in Xe-SF6 gas mixtures under controlled electric fields using a photoemission-driven experimental setup. A semitransparent CsI photocathode (53 nm thick) deposited on a quartz substrate generates photoelectrons, which drift through a uniform electric field validated by Ansys-Maxwell and Garfield++ simulations. Transverse diffusion coefficients were extracted using Gaussian fitting, minimizing systematic uncertainties from reflections and scintillation photons. This combined experimental and computational approach provides new insights into electron transport properties, supporting advancements in gaseous detectors for particle physics, medical imaging, and quantum technologies.
Paulo Brás, Paulo Silva, Jaime Silva